功能:平行平晶用于干涉法測量千分尺、卡規(guī)和千分表等測量面平面度、平面平行度。
產品規(guī)格:
每組平行平晶共四塊,分四個尺寸系列組
測量面上平面度偏差: <0.1μm
平面度局部偏差: >0.03μm
測量面平行度誤差: 組Ⅰ系列允差值:0.06μm 組Ⅱ、Ⅲ系列允差值:0.08μm 組Ⅳ系列允差值:0.1μm
組Ⅰ | 0-25mm | 4塊/組 | |
組Ⅱ | 25-50mm | 4塊/組 | |
組Ⅲ | 50-75mm | 4塊/組 | |
組Ⅳ | 75-100mm | 4塊/組 |
尺寸系列表
組號 | 0-25 | 25-50 | 50-75 | 75-100 |
1 | 15.00,15.12 | 40.00,40.12 | 65.00,65.12 | 90.00,90.12 |
2 | 15.12,15.25 | 40.12,40.25 | 65.12,65.25 | 90.12,90.25 |
3 | 15.25,15.37 | 40.25,40.37 | 65.25,65.37 | 90.25,90.37 |
4 | 15.37,15.50 | 40.37,40.50 | 65.37,65.50 | 90.37,90.50 |
5 | 15.50,15.62 | 40.50,40.62 | 65.50,65.62 | 90.50,90.62 |
6 | 15.62,15.75 | 40.62,40.75 | 65.62,65.75 | 90.62,90.75 |